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MCP-T700 低阻抗率計 MCP-T700型 (桌上型） |
人氣指數 |
8404 |
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| 型號：MCP-T700 |
| 中文名稱：低阻抗率計 MCP-T700型 (桌上型） |
| 英文名稱：Loresta-GX |
| 廠牌：日東精工分析科技 |
| 供應商：翔貿儀器有限公司 中央製作所 台灣總代理 |
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商 品 說 明 資 料 |
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 商品規格
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低阻抗率計 MCP-T700型 (桌上型)
Loresta-GX
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維持安定之高品質，依據世界唯一之四探針理論之高精度之阻抗率計
單體使用系統構築，用於生產技術、品質管理、研究開發
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導電性油漆、導電性漿糊、導電性塑膠、導電性橡膠、導電性薄膜、靜電材料、EMI屏蔽材料、導電纖維、導電陶瓷、半導體材料、LCD、TFT、ITO玻璃、晶元、手機外殼、手提電腦外殼、磁碟片…等
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顯示器：
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7.5吋彩色可觸控液晶螢幕，[Ω], [Ω/sq.], and [Ω•cm]一觸直讀數據
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測定範圍：
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10-4∼107Ω
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測定精度：
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±0.5%
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儲存數據：
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USB flash memory
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樣品保護功能：
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測定電壓 10V及 90V可選定切換
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尺寸：
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約 320 W× 285 D× 110 Hmm, 2.4KG
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標準配備
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 ASP探頭 MCP-TP03P(RMH110)《四探針探頭》
利用價值廣泛標準探頭JIS K7194對應，
Pin間 5mm，Pin尖 0.37R×4支，壓力 210g/支，
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MCP-TRF1 (RMH304)探頭檢驗片
ASP, ESP, LSP探頭用 (探頭檢驗片於測定前檢查之)
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 選購品
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ESP探頭 MCP-TPO8P(RMH114)《四探針探頭》
不均一樣品用
Pin間 5mm，Pin尖 2mm×4支，壓力 240g/支，
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PSP探頭 MCP-TP06P(RMH112)《四探針探頭》
小樣品或薄膜用
Pin間 1.5mm，Pin尖 0.26R×4支，壓力 70g/支，
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QP2探頭 MCP-TPQP2(RMH119)《四探針探頭》
微小樣品用
Pin間 1.5mm，Pin尖 0.26R×4支，壓力 70g/支，
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TFP探頭 MCP-TFP(RMJ217)《四探針探頭, 特殊用探頭》
Thin films on Si wafer用
Pin間 1.0mm，Pin尖 0.15R×4支，壓力 50g/支
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NSCP探頭 MCP-NSCP(RMJ202)《四探針探頭, 特殊用探頭》
Silicone wafer用
Pin間 1.0mm，Pin尖 0.04R×4支，壓力 250g/支
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BSP探頭 MCP-TP05P(RMH111)《四探針探頭, 特殊用探頭》
大樣品用
Pin間 2.5mm，Pin尖 0.37R×4支，壓力 210g/支
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LSP探頭 MCP-TPLSP(RMH116)《四探針探頭, 特殊用探頭》
Soft surface samples用
Pin間 5.0mm，Pin尖 2mm×4支，壓力 130g/支
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AP2探頭 MCP-TPAP2 (RMH333)《二探針探頭》
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BP探頭 MCP-TPBP(RMH118)《二探針探頭》
大樣品用
Pin尖 Ø 2×2支，壓力 240g/支
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MCP-TRPS(RMH311) 探頭檢驗片
PSP探頭用 (探頭檢驗片於測定前檢查之)
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MCP-TRTF(RMH312) 探頭檢驗片
TFP, NSCP探頭用 (探頭檢驗片於測定前檢查之)
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MCP-TRT2 (RMH335) 探頭檢驗片
AP2,BP探頭用 (探頭檢驗片於測定前檢查之)
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MCP-TRQP2 (RMH313) 探頭檢驗片
QP2探頭用 (探頭檢驗片於測定前檢查之)
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MCP-FS02 (RMJ802) 腳踏開關
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MCP-ST03(RMJ354) 絕緣板UFL
尺寸 300W×200L×10Hmm
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 MCP-T700 Loresta-GX
Accurate and quick measurement of materials’ resistivity 4 Terminal 4 Pin Method
High accuracy with eliminating contact resistance between sample and probe and lead wire’s resistance
MCP Probes’ spring contact method keeps constant pin pitch, pressure and contact area on samples
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Standard Configuration
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MCP-T700 Loresta-GX
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Expanded measuring range:0.001×10-4~9.999×107Ω
Operability on 7.5 inch color LCD touch screen
One-touch operation :Automatic measurement with functional Auto-hold and Timer Mode
Silicon Mode for silicon wafer measurement
Low conductive materials are acceptable by Selectable Applied Current Function
Current polarity reversing makes stable measurement
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Conductive paint, Conductive ink, Conductive paste, Resistive paste(carbon etc.), Conductive plastics,
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Standard equipment
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ASP MCP-TP03P (p/n RMH110)
Standard, Pin Interval 5mm,
Pin Top 0.37R ×4 pins
Pushing Pressure 210g/Pin
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MCP-TRF1 (p/n RMH304)
Linear 4 Pins, 1Ω
For ASP, ESP, LSP Probes
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Option
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ESP MCP-TP08P (p/n RMH114)
For non homogeneous samples,
Pin Interval 5mm,
Pin Top ψ2 × 4 pins
Pushing Pressure 240g/Pin
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PSP MCP-TP06P (p/n RMH112)
For small samples,
Pin Pitch 1.5mm,
Pin Points 0.26R × 4 pins
Spring pressure 70g/Pin
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QP2 MCP-TPQP2 (RMH119)
For very small samples,
Pin pitch 1.5mm
Pin points 0.26R × 4pins
Spring pressure 70g/pin
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TFP MCP-TFP (PMJ217)
For thin films on Si Wafer,
Pin pitch 1.0mm
In points ψ0.15 × 4pins
Spring pressure 50g/pin
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NSCP MCP-NSCP (PMJ202)
For Silicon Wafer,
Pin pitch 1.0mm
In points ψ0.04 × 4pins
Spring pressure 250g/pin
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BSP MCP-TP05P(RMH111)
For very large samples,
Pin pitch 2.5mm
Pin points 0.37R × 4pins
Spring pressure 210g/pin
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LSP MCP-TPLSP (RMH116)
For soft surface samples,
Pin pitch 5mm
Pin top hemisphere
2mm × 4pins
Spring pressure 130g/pin
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AP2 MCP-TPAP2 (RMH333)
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BP MCP-TPBP (p/n RMH118)
Resistance by 2 parts: Each part has apin,
In interval free,
Pin top ψ2 × 2 pins
Pushing pressure 240g/Pin
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MCP-TRPS (p/n RMH311)
Linear 4 Pins, 1Ω,
for PSP probe
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MCP-TRTF (p/n RMH312)
TFP, NSCP
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MCP-TRT2 (p/n RMH335)
2 Pins, 1Ω,
For AP2 probes
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MCP-TRQP2 (p/n RMH313)
4 Pins, 1Ω,
For QP2 probes
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MCP-FS02 (p/n RMJ802)
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MCP-ST03 (p/n RMJ354) UFL
300W×200L×10Hmm
Probe should be placed perpendicularly on samples.
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